Image processing apparatus and image processing method that adjust, based on a target object distance, at least one of brightness of emitted pattern light and an exposure amount

ABSTRACT

A processing apparatus includes an acquisition unit that acquires a captured image obtained by capturing, by an image capturing unit, a target object to which a projection unit has emitted pattern light. A derivation unit derives a distance from the image capturing unit to the target object by using the captured image. An adjustment unit adjusts, in accordance with the derived distance, at least one of a first parameter for controlling brightness of the pattern light emitted from the projection unit, and a second parameter for controlling an exposure amount of the image capturing unit.

CLAIM OF PRIORITY

This application claims the benefit of Japanese Patent Application No.2013-225819, filed Oct. 30, 2013, and No. 2013-225821, filed Oct. 30,2013, which are hereby incorporated by reference herein in theirentirety.

BACKGROUND OF THE INVENTION

Field of the Invention

The present invention relates to a technique for performing distancemeasurement with respect to a target object.

Description of the Related Art

There is known a method of projecting pattern light to a target objectusing a projection unit such as a projector, and specifying the positionof the pattern light from a captured image obtained by capturing thetarget object by an image capturing unit such as a camera, therebymeasuring a distance.

The reflectance of the surface of a target object and the orientation inwhich the target object is placed vary. Thus, the image luminancegradation value of pattern light projected from the projection unit in acaptured image changes variously. To specify the position of patternlight under various conditions, brightness adjustment of pattern lightand exposure amount adjustment of the image capturing unit need to beperformed appropriately. If these adjustments are improper, patternlight in a captured image is saturated or causes shadow detail loss, andthe position of the pattern light cannot be specified. Also, if theseadjustments are insufficient, the position of pattern light may bespecified, but the position specifying accuracy drops.

In Japanese Patent Laid-Open No. 2012-68176, the maximum reflectance isdetermined based on the image luminance gradation value of an imagecaptured after projecting uniform pattern light in advance, and thebrightness of pattern light and the exposure amount of the imagecapturing unit are determined based on the reflectance.

In Japanese Patent Laid-Open No. 2009-250844, the exposure amount of animage capturing unit is adjusted using the histogram of the imageluminance gradation value of an image captured after projecting anoptical cutting line. More specifically, in the image luminancegradation value histogram, the difference between the first peak,corresponding to an optical cutting line portion, and the second peak,corresponding to background light generated by illumination light in ameasurement environment, is adjusted to be equal to or greater than athreshold. Further, the first peak is adjusted not to exceed a presetupper limit value.

In the method disclosed in Japanese Patent Laid-Open No. 2012-68176, thebrightness of pattern light and the exposure amount of the imagecapturing unit are determined based on the image luminance gradationvalue of, not pattern light used to specify a position, but uniformpattern light. Thus, the influence of a decrease in the contrast ofpattern light arising from, for example, a blur in the projectionoptical system or an image capturing optical system that is generated inpattern light used to specify a position is not taken into account. As aresult, adjustment in the pattern light becomes insufficient, and thepattern position specifying accuracy may drop. Also, the maximumreflectance and exposure amount are determined based on the maximumvalue of the image luminance gradation value. When the target object ishighly glossy, no appropriate adjustment may be performed throughout theentire frame under the influence of partially generated halation.

The invention disclosed in Japanese Patent Laid-Open No. 2009-250844effectively functions in a case in which the peak of the image luminancegradation value histogram by projection light and the peak of backgroundlight are clearly separated. In a case in which the luminance ofbackground light is high and is almost equal to the luminance ofprojection light, however, it is difficult to discriminate the peaks ofthe image luminance gradation value histograms of projection light andbackground light, and the invention may not effectively function.

There is known a recognition processing apparatus that estimates thepositions and orientations of a plurality of piled target objects basedon distance measurement results by a distance measurement apparatusconfigured to perform the above-described distance measurement. A systemcan be constructed, in which the robot can automatically pick piledtarget objects by outputting, to a robot control apparatus, theestimation results of the positions and orientations of target objectsby the recognition processing apparatus.

Assuming a scene in which many target objects are piled, the distancefrom the apparatus to a target object changes depending on the height ofthe pile. If the distance from the apparatus to a target object changes,the illuminance of projection pattern light and the brightness of acaptured image change. More specifically, the brightness of a capturedimage decreases in proportion to the square of the distance from theapparatus to a target object.

Further, light falloff at edges occurs in accordance with the positionof a target object in a captured image and the position of the targetobject in the projection range, and the brightness of the captured imagechanges. That is, the captured image becomes brighter toward the centerof the frame, and darker toward the edge. For example, the capturedimage becomes dark based on the cosine fourth-power law.

In this manner, the image luminance gradation value of pattern lightprojected from the projection unit in a captured image changes variouslyin accordance with the distance to a target object or the position inthe captured image. If the captured image becomes dark, the influence ofnoise of an image capturing element increases, and the distancemeasurement accuracy decreases. The decrease in distance measurementaccuracy decreases even the estimation accuracy of the position andorientation of a target object by the recognition processing apparatus.The picking system may cause a failure such as a failure in picking atarget object by the robot.

To perform distance measurement at high accuracy regardless of thedistance or the position in the captured image, brightness adjustment ofpattern light and exposure amount adjustment of the image capturing unitneed to be performed appropriately in accordance with the distance orthe position in the frame. If these adjustments are improper, patternlight in a captured image is saturated or causes shadow detail loss, anddistance measurement becomes impossible. If these adjustments areinsufficient, distance measurement may be possible, but the measurementaccuracy drops.

Japanese Patent Laid-Open No. 2000-292133 has disclosed a method ofarranging an element in which the transmittance is low at the center andincreases toward the edge so as to cancel the influence of light falloffat edges. Japanese Patent Laid-Open No. 2000-241131 has disclosed arange finder apparatus that controls an optical output from a lightsource based on the measurement result of a rough distance.

In the method disclosed in Japanese Patent Laid-Open No. 2000-292133,the illuminance of the illumination becomes constant for target objectsplaced at the same distance, and a decrease in accuracy by light falloffat edges can be suppressed. To the contrary, the illuminance does notbecome constant for target objects at different depths. For this reason,the method disclosed in Japanese Patent Laid Open No. 2000-292133decreases the accuracy.

In the method disclosed in Japanese Patent Laid-Open No. 2000-241131,the exposure amount of the entire frame is adjusted based on a roughdistance. However, optimal exposure amount adjustment is not implementedfor a target object placed at a specific position in the projectionarea.

SUMMARY OF THE INVENTION

The present invention has been made to solve the above-describedproblems, and provides a technique for reliably specifying the positionof pattern light at high accuracy.

The present invention also provides a technique for performing distancemeasurement with respect to each target object at higher accuracy.

According to a first aspect, the present invention provides an imageprocessing apparatus comprising an acquisition unit configured toacquire a captured image obtained by capturing, by an image capturingunit, a target object to which a pattern has been projected, and anadjustment unit configured to adjust, based on the pattern in theacquired captured image, at least one of a first parameter forcontrolling brightness of the pattern projected from a projection unitconfigured to project the pattern, and a second parameter forcontrolling an exposure amount of the image capturing unit.

According to a second aspect, the present invention provides an imageprocessing apparatus comprising an acquisition unit configured toacquire a captured image obtained by capturing, by an image capturingunit, a target object to which a pattern has been projected, a unitconfigured to specify a maximum pixel value among pixel values ofrespective pixels referred to detect a position of the pattern from thecaptured image, and acquire a distribution of the maximum pixel value,and an adjustment unit configured to adjust, by using the distribution,a first parameter for controlling brightness of the pattern projectedfrom a projection unit configured to project the pattern, or a secondparameter for controlling an exposure amount of the image capturingunit.

According to a third aspect, the present invention provides an imageprocessing method to be performed by an image processing apparatus,comprising an acquisition step of acquiring a captured image obtained bycapturing, by an image capturing unit, a target object to which apattern has been projected, and an adjustment step of adjusting, basedon the pattern in the acquired captured image, at least one of a firstparameter for controlling brightness of the pattern projected from aprojection unit configured to project the pattern, and a secondparameter for controlling an exposure amount of the image capturingunit.

According to a fourth aspect, the present invention provides an imageprocessing method to be performed by an image processing apparatus,comprising an acquisition step of acquiring a captured image obtained bycapturing, by an image capturing unit, a target object to which apattern has been projected, a step of specifying a maximum pixel valueamong pixel values of respective pixels referred to detect a position ofthe pattern from the captured image, and acquiring a distribution of themaximum pixel value, and an adjustment step of adjusting, by using thedistribution, a first parameter for controlling brightness of thepattern projected from a projection unit configured to project thepattern, or a second parameter for controlling an exposure amount of theimage capturing unit.

According to a fifth aspect, the present invention provides acomputer-readable storage medium storing a computer program for causinga computer to function as an acquisition unit configured to acquire acaptured image obtained by capturing, by an image capturing unit, atarget object to which a pattern has been projected, and an adjustmentunit configured to adjust, based on the pattern in the acquired capturedimage, at least one of a first parameter for controlling brightness ofthe pattern projected from a projection unit configured to project thepattern, and a second parameter for controlling an exposure amount ofthe image capturing unit.

According to a sixth aspect, the present invention provides an imageprocessing apparatus comprising an acquisition unit configured toacquire a captured image obtained by capturing, by an image capturingunit, a target object to which a projection unit has projected apattern, a derivation unit configured to derive a distance from theimage capturing unit to the target object by using the captured image,and an adjustment unit configured to adjust, in accordance with thederived distance, at least one of a first parameter for controllingbrightness of the pattern projected from the projection unit, and asecond parameter for controlling an exposure amount of the imagecapturing unit.

According to a seventh aspect, the present invention provides an imageprocessing method to be performed by an image processing apparatus,comprising an acquisition step of acquiring a captured image obtained bycapturing, by an image capturing unit, a target object to which aprojection unit has projected a pattern, a derivation step of deriving adistance from the image capturing unit to the target object by using thecaptured image, and an adjustment step of adjusting, in accordance withthe derived distance, at least one of a first parameter for controllingbrightness of the pattern projected from the projection unit, and asecond parameter for controlling an exposure amount of the imagecapturing unit.

According to an eighth aspect, the present invention provides acomputer-readable storage medium storing a computer program for causinga computer to function as an acquisition unit configured to acquire acaptured image obtained by capturing, by an image capturing unit, atarget object to which a projection unit has projected a pattern, aderivation unit configured to derive a distance from the image capturingunit to the target object by using the captured image, and an adjustmentunit configured to adjust, in accordance with the derived distance, atleast one of a first parameter for controlling brightness of the patternprojected from the projection unit, and a second parameter forcontrolling an exposure amount of the image capturing unit.

Further features of the present invention will become apparent from thefollowing description of exemplary embodiments with reference to theattached drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram showing an example of the functionalarrangement of an image processing apparatus;

FIGS. 2A to 2G are views each showing an example of projection light;

FIG. 3 is a view showing a four-bit gray code;

FIG. 4 is a schematic view showing the relationship among an imagecapturing unit 20, a projection unit 30, and a target object 5;

FIGS. 5A and 5B are graphs for explaining the pattern positionspecifying accuracy;

FIGS. 6A to 6C are graphs for explaining a change of the luminancegradation value upon changing the exposure time;

FIG. 7 is a view for explaining a case in which a highly glossy targetobject is used as the target object 5;

FIG. 8 is a flowchart showing processing to be performed by an imageprocessing unit 40;

FIG. 9 is a flowchart showing details of processing in step S4105;

FIG. 10 is a block diagram showing an example of the functionalarrangement of an image processing apparatus;

FIG. 11 is a flowchart showing processing to be performed by the imageprocessing unit 40;

FIG. 12 is a flowchart showing details of processing in step S4123;

FIGS. 13A and 13B are graphs for explaining processes in steps S4222 andS4223;

FIG. 14 is a view showing an example of pattern light used in amodification;

FIGS. 15A to 15D are graphs showing the luminance gradation value anddifference value;

FIG. 16 is a block diagram showing an example of the hardwarearrangement of an apparatus applicable to the image processing unit 40;

FIG. 17 is a block diagram showing an example of the functionalarrangement of a target object picking system 508;

FIGS. 18A to 18C are views for explaining a change of the height of aplurality of piled parts;

FIGS. 19A to 19C are graphs for explaining the relationship between aluminance value in a captured image and a distance to an image capturingtarget;

FIG. 20 is a flowchart showing processing to be performed by an imageprocessing unit 5040;

FIGS. 21A and 21B are views for explaining processing in step S50106;

FIG. 22 is a flowchart showing processing to be performed by the imageprocessing unit 5040;

FIG. 23 is a view for explaining a triangulation correction amount Czt;

FIG. 24 is a block diagram showing an example of the functionalarrangement of the target object picking system 508;

FIG. 25 is a view for explaining the relationship between the positionand orientation of a target object, and the angle θ of view with respectto the target object;

FIG. 26 is a flowchart showing processing to be performed by the imageprocessing unit 5040;

FIGS. 27A and 27B are flowcharts showing details of processing in stepS50300; and

FIG. 28 is a flowchart showing details of processing in step S50310.

DESCRIPTION OF THE EMBODIMENTS

Embodiments of the present invention will now be described withreference to the accompanying drawings. Note that the embodiments to bedescribed below are examples of a detailed implementation of the presentinvention, and are detailed examples of the arrangement described in theappended claims.

First Embodiment

First, an example of the functional arrangement of an image processingapparatus (distance measurement apparatus) according to the firstembodiment will be described with reference to the block diagram ofFIG. 1. As shown in FIG. 1, the image processing apparatus includes aprojection unit 30 that projects pattern light to a target object 5, animage capturing unit 20 that captures the target object 5 to which thepattern light has been projected, and an image processing unit 40 thatcontrols the projection unit 30 and image capturing unit 20, andperforms distance measurement with respect to the target object 5 basedon a space encoding method.

First, the projection unit 30 will be explained. As shown in FIG. 1, theprojection unit 30 includes a light source 31, an illumination opticalsystem 32, a display element 33, a projection stop 34, and a projectionoptical system 35.

The light source 31 is, for example, one of various light emittingelements such as a halogen lamp and an LED. The illumination opticalsystem 32 is an optical system having a function of guiding lightemitted by the light source 31 to the display element 33. For example,an optical system suited to make uniform the luminance, such as Koehlerillumination or a diffusion plate, is used. The display element 33 is anelement having a function of spatially controlling the transmittance orreflectance of light traveling from the illumination optical system 32in accordance with a supplied pattern. For example, a transmission LCD,reflection LCOS, or DMD is used. As for supply of a pattern to thedisplay element 33, a plurality of types of patterns held in theprojection unit 30 may be sequentially supplied to the display element33. Alternatively, a plurality of types of patterns held in an externalapparatus (for example, the image processing unit 40) may besequentially acquired and supplied to the display element 33. Theprojection optical system 35 is an optical system configured to formlight (pattern light) guided from the display element 33 into an imageat a specific position of the target object 5. The projection stop 34 isused to control the F-number of the projection optical system 35.

Next, the image capturing unit 20 will be explained. As shown in FIG. 1,the image capturing unit 20 includes an image capturing optical system23, an image capturing stop 22, and an image capturing element 21.

The image capturing optical system 23 is an optical system configured toimage a specific position of the target object 5 on the image capturingelement 21. The image capturing stop 22 is used to control the F-numberof the image capturing optical system 23. The image capturing element 21is, for example, one of various photoelectric conversion elements, suchas a CMOS sensor and a CCD sensor. Note that an analog signalphotoelectrically converted by the image capturing element 21 is sampledand quantized by a control unit (not shown) in the image capturing unit20, and is converted into a digital image signal. Further, the controlunit generates, from the digital image signal, an image (captured image)in which each pixel has a luminance gradation value (density value andpixel value). The control unit appropriately sends the captured image toa memory in the image capturing unit 20 or to the image processing unit40.

Note that the image capturing unit 20 captures the target object 5 everytime the projection unit 30 projects different pattern light. Morespecifically, the image capturing unit 20 and projection unit 30 operatesynchronously, and the image capturing unit 20 can capture the image ofthe target object 5 to which each different pattern light has beenprojected.

Next, the image processing unit 40 will be explained. As shown in FIG.1, the image processing unit 40 includes an adjustment unit 41, abright/dark portion determination unit 42, a pattern position specifyingunit 43, a distance measurement unit 44, a pattern light brightnesscontrol unit 45, and a captured image exposure amount control unit 46.

The pattern position specifying unit 43 acquires an image captured bythe image capturing unit 20, and specifies, from the acquired capturedimage, the position (pattern position) of pattern light in the capturedimage.

The bright/dark portion determination unit 42 acquires an image capturedby the image capturing unit 20, and performs bright/dark portiondetermination by using the luminance gradation value of each pixelconstituting the acquired captured image, and a pattern positionspecified from the captured image by the pattern position specifyingunit 43.

In accordance with the result of determination by the bright/darkportion determination unit 42, the adjustment unit 41 determinesparameters for controlling the bright/dark portion of an image to becaptured next time by the image capturing unit 20. The “parameters forcontrolling the bright/dark portion of an image to be captured next timeby the image capturing unit 20” include a parameter for the imagecapturing unit 20, and a parameter for the projection unit 30. Both oreither of the parameters may be determined.

When the adjustment unit 41 determines the “parameter for the projectionunit 30”, the pattern light brightness control unit 45 controls thebrightness of pattern light projected from the projection unit 30 inaccordance with the parameter. The method of controlling the brightnessof pattern light includes, for example, the following three methods.

The first method is to control the emission luminance of the lightsource 31. In the case of a halogen lamp, when the application voltageis increased, the emission luminance increases. In the case of an LED,when a current to be supplied is increased, the emission luminanceincreases. In this case, the “parameter for the projection unit 30” is aparameter for controlling the emission luminance of the light source 31.

The second method is to control the display gradation value of thedisplay element 33. In the case of an LCD, when the display gradationvalue is increased, the transmittance increases, and pattern lightbecomes bright. In the case of an LCOS, when the display gradation valueis increased, the reflectance increases, and pattern light becomesbright. In the case of a DMD, when the display gradation value isincreased, the ON count per frame increases, and pattern light becomesbright. In this case, the “parameter for the projection unit 30” is aparameter for controlling the display gradation value of the displayelement 33.

The third method is to control the projection stop 34. When the stop isopened, pattern light becomes bright. To the contrary, when the stop isnarrowed, pattern light becomes dark. When controlling the projectionstop 34, the depth of field of the projection optical system alsochanges, so this influence needs to be considered. In this case, the“parameter for the projection unit 30” is a parameter for controllingthe projection stop 34.

When the adjustment unit 41 determines the “parameter for the imagecapturing unit 20”, the captured image exposure amount control unit 46controls, in accordance with the parameter, an exposure amount at thetime of image capturing by the image capturing unit 20, therebycontrolling the luminance gradation value of a captured image. Themethod of controlling the exposure amount of the image capturing unit 20includes, for example, the following two methods.

The first method is to control the exposure time (shutter speed) of theimage capturing element 21. When the exposure time is prolonged, theluminance gradation value of a captured image increases. In contrast,when the exposure time is shortened, the luminance gradation valuedecreases. In this case, the “parameter for the image capturing unit 20”is a parameter for controlling the exposure time (shutter speed) of theimage capturing element 21.

The second method is to control the image capturing stop 22. When thestop is opened, the luminance gradation value of a captured imageincreases. Conversely, when the stop is narrowed, the luminancegradation value of a captured image decreases. When controlling theimage capturing stop 22, the depth of field of the image capturingoptical system also changes, so this influence needs to be considered.In this case, the “parameter for the image capturing unit 20” is aparameter for controlling the image capturing stop 22.

The distance measurement unit 44 acquires an image captured by the imagecapturing unit 20 every time the projection unit 30 projects each of aplurality of types of pattern beams. Then, the distance measurement unit44 measures a distance from the image capturing unit 20 (image capturingoptical system 23) to the target object 5 by the triangulation principleusing a space code decoded from the acquired captured image, and apattern position specified by the pattern position specifying unit 43for the acquired captured image.

Although distance measurement is performed based on the space encodingmethod in the embodiment, as described above, there are a plurality ofderivative forms for the space encoding method. The embodiment adopts amethod disclosed in Japanese Patent Laid-Open No. 2011-47931. Theprinciple of this method will be explained briefly.

FIGS. 2A to 2G show projection patterns (pattern beams) in a four-bitspace encoding method. A projection pattern (full light-on pattern)shown in FIG. 2A, and a projection pattern (full light-off pattern)shown in FIG. 2B are used to detect a shadow region and to determine abright/dark portion determination threshold. Projection patterns(positive patterns of one bit to four bits, respectively) in FIGS. 2C to2F are used to determine a space code. A projection pattern (four-bitnegative pattern) in FIG. 2G is used to specify a pattern position athigh accuracy together with the four-bit positive pattern.

For four bits, the number of the space code is sixteen. Letting N be thenumber of bits of a projection pattern, the number of the space codebecomes 2N. In the projection patterns of one bit to four bits shown inFIGS. 2A to 2G, the layout of bright and dark (white and black) portionsof a pattern is determined based on a sign called a gray code. FIG. 3shows a four-bit gray code. The gray code is a pattern in which theHamming distance between adjacent codes becomes 1. Even if the codedetermination is erroneous, the error can be minimized. Thus, the graycode is often used as a projection pattern in the space encoding method.

Next, a method of decoding a space code from a captured image will beexplained. The projection patterns of one bit to four bits shown inFIGS. 2A to 2G are projected to a measurement target object, and theimages of the measurement target object to which the respectiveprojection patterns have been projected are captured. Based on theluminance gradation value of each pixel in each captured image obtainedby the image capturing, it is determined whether the pixel is a portionirradiated with the bright portion of the projection pattern or aportion irradiated with the dark portion. The determination criterionfor this determination can use the average value of the luminancegradation values of the full light-on pattern and full light-offpattern. More specifically, for each pixel in the captured image, if theluminance gradation value of the pixel is equal to or greater than theaverage value, it is determined that the pixel is the bright portion; ifthe luminance gradation value of the pixel is lower than the averagevalue, it is determined that the pixel is the dark portion. A bit value“1” is assigned to a pixel determined to be the bright portion, and abit value “0” is assigned to a pixel determined to be the dark portion.This processing is performed for each of the captured images of theprojection patterns of one bit to four bits, giving a bit value of fourbits (gray code of four bits) to each pixel in the captured image. Byconverting the four-bit gray code into a space code, the exit directionfrom the projection unit can be uniquely specified. For example, when acode “0110” is assigned to a given pixel, as shown in FIG. 3, the graycode is six. This gray code is converted into a space code of four.

As shown in FIG. 4, the incident direction of light to the imagecapturing unit (more specifically, the principal point position of theimage capturing unit) is determined from a pixel position in a capturedimage. When the space code of the pixel position is determined, the exitdirection from the projection unit is specified. After the twodirections are determined, distance measurement with respect to ameasurement target object becomes possible based on the triangulationprinciple. This is the distance measurement principle based on the spaceencoding method.

The space encoding method can reduce an error by also using patternlight obtained by inverting the bright and dark portions of theprojection pattern (in FIGS. 2A to 2G, the four-bit negative pattern inFIG. 2G). The error reduction method will be explained subsequently withreference to FIG. 4.

Since the exit direction from the projection unit has a spreadcorresponding to the width of one space code, a distance measurementerror is generated by AZ. To reduce the error, a negative pattern (inFIGS. 2A to 2G, the four-bit negative pattern in FIG. 2G) obtained byinverting the bright and dark portions of the projection pattern (inFIGS. 2A to 2G, the four-bit positive pattern in FIG. 2F) of the leastsignificant bit (in FIGS. 2A to 2G, the fourth bit) is furtherprojected. An intersection point position between a luminance valuewaveform formed from the luminance values of respective pixelsconstituting the captured image of a target object to which the positivepattern has been projected, and a luminance value waveform formed fromthe luminance values of respective pixels constituting the capturedimage of the target object to which the negative pattern has beenprojected is set as a pattern position. This pattern position is usedfor the distance measurement. The intersection point position is aboundary position between adjacent space codes, and ideally, does nothave a width. In practice, the width is not zero, because quantizationand sampling are executed when receiving a captured image as a digitalimage signal, and the luminance gradation value of the captured imagecontains image capturing element noise. The distance measurement error,however, can be greatly reduced. The pattern position specifying unit 43executes the processing of specifying the intersection point position.The method of reducing the distance measurement error has beenexplained.

Next, the pattern position specifying accuracy will be explained withreference to FIGS. 5A and 5B. FIG. 5A is a graph in which the abscissarepresents the image coordinate, and the ordinate represents theluminance gradation value. The image coordinate along the abscissa is acoordinate in a direction perpendicular to the direction of the stripeof a projection pattern in a captured image. A solid line indicates aluminance value waveform (positive pattern waveform) formed from theluminance values of respective pixels on one line in the directionperpendicular to the direction of the stripe of the positive pattern. Adotted line indicates a luminance value waveform (negative patternwaveform) formed from the luminance values of respective pixels on oneline in the direction perpendicular to the direction of the stripe ofthe negative pattern. Note that the respective waveforms are luminancevalue waveforms formed from the luminance values of respective pixels onthe line at the same position in each captured image. FIG. 5B is anenlarged view showing the respective waveforms in a region surrounded bya thick solid line.

In FIG. 5B, attention is paid to four points (all on the positivepattern waveform or negative pattern waveform) near the intersectionpoint between the positive pattern waveform and the negative patternwaveform. PL is a luminance gradation value at a point on the positivepattern waveform out of two points (their image coordinates (valuesalong the abscissa) are the same) on the left side from the intersectionpoint position, and NL is a luminance gradation value at a point on thenegative pattern waveform. Also, PR is a luminance gradation value at apoint on the positive pattern waveform out of two points (their imagecoordinates (values along the abscissa) are the same) on the right sidefrom the intersection point position, and NR is a luminance gradationvalue at a point on the negative pattern waveform. DL is the absolutevalue of the difference (PL−NL) between the luminance gradation values,and DR is the absolute value of the difference (PR−NR) between theluminance gradation values.

Luminance waveforms near the intersection point are linearlyapproximated (a luminance waveform between the point of the luminancegradation value PL and the point of the luminance gradation value PR,and a luminance waveform between the point of the luminance gradationvalue NL and the point of the luminance gradation value NR areapproximated by straight lines, respectively). Then, an intersectionpoint position C (image coordinate) between the respective straightlines is given by:C=L+DL/(DL+DR)  (1)where L is the image coordinate (value along the abscissa) of the pointof the luminance gradation value PL (point of the luminance gradationvalue NL). For descriptive convenience, the intersection point positionC will be explained as a relative position using, as a reference, theimage coordinate of the point of the luminance gradation value PL (pointof the luminance gradation value NL). Thus, C=DL/(DL+DR).

Assume that the luminance gradation values PL, PR, NL, and NR have afluctuation of only image capturing element noise G. At this time, eventhe intersection point position has a fluctuation of only a width ΔC.This width is the sub-pixel position estimation error of theintersection point. The sub-pixel position estimation error ΔC can becalculated by:ΔC=σ/(DL+DR).  (2)

As the sub-pixel position estimation error ΔC of the intersection pointbecomes smaller, the distance measurement error becomes smaller.Equation (2) reveals that the sub-pixel position estimation error ΔC canbe reduced by increasing the denominator (DL or DR value as thedifference between luminance gradation values). The difference DL (DR)between luminance gradation values increases in proportion to theluminance gradation value. Further, a shot noise component out of theimage capturing element noise σ often exhibits a characteristic in whichthe shot noise component is proportional to the value of the square rootof the luminance gradation value. Hence, by increasing the luminancegradation value, the influence of the noise σ is relatively reduced. Toincrease the luminance gradation value, there are two methods: toincrease the exposure amount in the image capturing unit 20, and toincrease the brightness of pattern light.

Both or either of these two methods can be executed. In the embodiment,for example, only the method of controlling the exposure amount in theimage capturing unit 20 is executed. Further, in the exposure amountcontrol method, only the exposure time is controlled. However, controlof the exposure amount can be implemented by a method other than controlof the exposure time, and is not limited to a specific method. Thecontrol is applicable to even a method of controlling the imagecapturing stop 22, out of the exposure amount control method. Thecontrol is also applicable to control of the emission luminance of thelight source 31, to control of the display gradation value of thedisplay element 33, and to control of the projection stop 34, which is amethod of controlling the brightness of pattern light. The method is notlimited to a method of controlling only a single controlled variable,and a plurality of controlled variables can also be controlledsimultaneously.

Next, a change of the luminance gradation value upon changing theexposure time will be described with reference to FIGS. 6A to 6C. N isthe current exposure time. FIG. 6A shows the waveforms of the luminancegradation values of images captured in the exposure time N. In the stateof FIG. 6A, none of the waveforms of the luminance gradation valuesreaches the saturation level, so there is room for improving theaccuracy. It is not desired, however, to unnecessarily prolong theexposure time.

FIG. 6B shows the waveforms of luminance gradation values when theexposure time is doubled to be 2N. The waveforms exceed the saturationlevel at the center. FIG. 6B shows the waveforms exceeding thesaturation level for convenience. In practice, a waveform exceeding thesaturation level is cut at the luminance gradation value of thesaturation level and output. In FIG. 6B, the intersection point positionis cut at the luminance gradation value of the saturation level, andcannot be specified. To achieve both specifying of the intersectionpoint position and reduction of the sub-pixel estimation error, a stateis desirable, in which a luminance gradation value near the intersectionpoint position used to specify a pattern position in the waveform of theluminance gradation value is adjusted to a level, one step short of thesaturation level.

FIG. 6C shows the waveforms of luminance gradation values when theexposure time is multiplied by 1.5 to be 1.5N. In FIG. 6C, the waveformof the full light-on pattern and the waveforms of the positive andnegative patterns partially exceed the saturation level, but a luminancegradation value near an intersection point position used to specify apattern position does not exceed the saturation level. For this reason,the intersection point position can be specified, and the sub-pixelposition estimation error can be reduced, because the luminancegradation value near the intersection point becomes large.

Note that, when a highly glossy target object, such as a metal, is usedas the target object 5, the specular reflection condition is establishedat only part of the target object, and the luminance gradation value maybecome greatly large. FIG. 7 shows an example of this. Assume that, at apoint 51 on the target object 5 that is a highly glossy target object,the specular reflection condition is established between incident lightfrom the projection unit and reflected light toward the image capturingunit. The specular reflection condition is a condition that the incidentangle of incident light and the reflection angle of reflected lightbecome equal. At this time, when the glossiness of the target object 5is high, reflected light from this region becomes brighter than theperipheral light, and as a result, the luminance gradation value becomesgreatly large. If the luminance value at this portion is adjusted not toreach the saturation level, the luminance of the entire image excludingthis portion decreases, and the distance measurement accuracy of theentire image decreases. To solve this, the embodiment introduces amechanism that permits a certain number of pixels with respect to thetotal number of pixels of an entire target region (for example, a regionincluding the target object 5) in an image to reach the saturationlevel. This mechanism will be explained in detail in a descriptionregarding the bright/dark portion determination unit 42.

As described above, the embodiment provides a method of adjusting theexposure amount of a captured image and the brightness of pattern lightso that the luminance gradation value of a pixel used to specify apattern position is set to a level, one step short of the saturationlevel. Accordingly, the pattern position can be specified at highaccuracy. Further, the embodiment provides a method of setting thepermissible range of the saturation level to improve, even for a targetobject in which the luminance gradation value is excessively saturatedin a partial region, the pattern position specifying accuracy in theentire image while sacrificing the partial region.

Next, processing to be performed by the image processing unit 40 inorder to adjust the exposure amount of the image capturing unit 20 willbe explained with reference to FIG. 8, showing the flowchart of thisprocessing. First, in step S4101, the adjustment unit 41 sets theinitial value (parameter) of the exposure amount that has been set inadvance or set by the user via an operation unit (not shown). Thecaptured image exposure amount control unit 46 controls the exposureamount of the image capturing unit 20 in accordance with the initialvalue of the exposure amount. The adjustment unit 41 sets the initialvalue (parameter) of the brightness of pattern light that has been setin advance or set by the user via the operation unit (not shown). Thepattern light brightness control unit 45 controls the brightness ofpattern light projected from the projection unit 30 in accordance withthe initial value of the brightness of pattern light. The adjustmentunit 41 sets the initial value (parameter) of the change amount of theexposure amount. The initial value of the change amount of the exposureamount suffices to be, for example, one half of the initial value of theexposure amount. Needless to say, the initial value of the change amountof the exposure amount is not limited to this.

In step S4102, the adjustment unit 41 sets a value AN (AN is an integerof two or more) as the upper limit value of the number of adjustments ofthe exposure amount. As the number of adjustments becomes larger, fineradjustment can be performed, but the time taken until the end ofadjusting the exposure amount becomes longer. The number of adjustmentsis desirably about ten-odd, empirically. In step S4103, the adjustmentunit 41 sets a value “1” in a counter k for counting the number ofadjustments of the exposure amount.

In step S4104, the projection unit 30 sequentially selects one by one aplurality of projection patterns described above, and irradiates thetarget object 5 with the selected projection pattern. The imagecapturing unit 20 captures the target object 5. The types of projectionpatterns are four: a full light-on pattern, a full light-off pattern, apositive pattern (in FIGS. 2A to 2G, the four positive patterns in FIGS.2C to 2F), and a negative pattern (in FIGS. 2A to 2G, the negativepattern in FIG. 2G). The four-bit space encoding method uses a four-bitpositive pattern as the positive pattern, and a four-bit negativepattern as the negative pattern. The image capturing unit 20 capturesthe target object 5 every time the selected pattern light is projected.

In step S4105, the bright/dark portion determination unit 42 and patternposition specifying unit 43 perform bright/dark portion determinationusing an image captured by the image capturing unit 20. Details of theprocessing in step S4105 will be described later with reference to theflowchart of FIG. 9. If it is determined as a result of the bright/darkportion determination that the pixel is the bright portion, the processadvances to step S4106. If it is determined that the pixel is the darkportion, the process advances to step S4107.

In step S4106, the adjustment unit 41 changes, by the change amount, theparameter representing the current exposure amount of the imagecapturing unit 20 so that an image to be captured next time by the imagecapturing unit 20 becomes darker than the currently captured image. Thecaptured image exposure amount control unit 46 controls the exposureamount of the image capturing unit 20 in accordance with the adjustedparameter.

In step S4107, the adjustment unit 41 changes, by the change amount, theparameter representing the current exposure amount of the imagecapturing unit 20, so that an image to be captured next time by theimage capturing unit 20 becomes brighter than the currently capturedimage. The captured image exposure amount control unit 46 controls theexposure amount of the image capturing unit 20 in accordance with theadjusted parameter.

In step S4108, the adjustment unit 41 determines whether the value ofthe counter k has exceeded AN. If it is determined that k>AN, theprocess ends. If it is determined that k≦AN, the process advances tostep S4109.

In step S4109, the adjustment unit 41 increments the value of thecounter k by one. In step S4110, the adjustment unit 41 updates thechange amount of the exposure amount. It is desirable to graduallydecrease the change amount as the number of adjustments increases. Forexample, a method such as binary search is conceivable. According tothis method, the change amount is updated to one half of the previouschange amount.

After the change amount is updated in step S4110, the processes in stepsS4104 to S4110 are repetitively executed while k≦AN is satisfied. As thenumber of adjustments increases, the exposure amount is updatedsearchingly and comes close to an appropriate exposure amount.

Next, details of the above-described processing in step S4105 will beexplained with reference to the flowchart of FIG. 9. The bright/darkportion determination unit 42 performs bright/dark portion determinationby using four captured images In1 to In4, and outputs either of Out1:dark portion determination and Out2: bright portion determination as theresult of bright/dark portion determination. The captured image In1 is acaptured image of the target object 5 to which the full light-on patternhas been projected. The captured image In2 is a captured image of thetarget object 5 to which the full light-off pattern has been projected.The captured image In3 is a captured image of the target object 5 towhich the positive pattern has been projected. The captured image In4 isa captured image of the target object 5 to which the negative patternhas been projected.

The bright/dark portion determination is executed in two stages. In thefirst stage, rough bright/dark portion determination is performed usingthe captured images In1 and In2. In the second stage, detailedbright/dark portion determination is performed using the captured imagesIn3 and In4. In the description of the embodiment, bright/dark portiondetermination is performed in the two, first and second stages. It isalso possible, however, to omit bright/dark portion determination in thefirst stage and to perform only bright/dark portion determination in thesecond stage.

Bright/dark portion determination in the first stage will be explainedfirst.

In step S4201, the bright/dark portion determination unit 42 sets anadjustment region in the captured image In1 or In2. For example, eitherthe captured image In1 or In2 is displayed as a display target image ona display unit (not shown), and the user operates an operation unit (notshown) to designate (set), as the adjustment region, the region of thetarget object 5 in the display target image. As a matter of course, theadjustment region setting method is not limited to this. When the regionof the target object 5 in the captured image In1 or In2 has beendetermined in advance or is determined by recognition processing, theregion of the target object 5 may be set as the adjustment regionwithout the intervention of the user operation. Assume that, when theadjustment region is set in one captured image, it is also set at thesame position in the other captured image. In step S4202, thebright/dark portion determination unit 42 counts the number of pixels inthe adjustment region as the “number X of pixels in the adjustmentregion”.

In step S4203, the bright/dark portion determination unit 42 detects aregion (shadow region) seemed to be a shadow from the adjustment regionin the captured image In1 or the adjustment region in the captured imageIn2. For example, the shadow region detection method is as follows. Morespecifically, the difference value of the luminance gradation value,between pixels whose positions correspond to each other, among pixelswithin the adjustment region in the captured image In1 and pixels withinthe adjustment region in the captured image In2, is calculated. A regionformed from pixels at pixel positions at which the difference value isless than a preset threshold (shadow region threshold) is determined asthe shadow region. The difference value, however, becomes small even ina case in which the luminance gradation value within the adjustmentregion in the captured image In2 is close to or has reached thesaturation level. By only the above determination method, such a regionis determined as the shadow region. To cope with this case, it is betterto introduce a determination equation in which, when a value obtained byadding the value of the shadow region threshold to the luminancegradation value of the captured image In2 exceeds the saturation level,excluding the luminance gradation value from the shadow region. Needlessto say, the method of specifying a shadow region from an image is notlimited to the above-described method.

In step S4204, the bright/dark portion determination unit 42 obtains, asthe number Y of pixels in a non-shadow region, the remaining number ofpixels by subtracting the number of pixels in the shadow region detectedin step S4203 from the number of pixels in the adjustment region countedin step S4202. The number of pixels in the non-shadow region is thenumber of pixels in a remaining region obtained by excluding the shadowregion from the adjustment region.

In step S4205, the bright/dark portion determination unit 42 determineswhether a value (ratio of the number Y of pixels in the non-shadowregion to the number X of pixels in the adjustment region) obtained bydividing the number Y of pixels in the non-shadow region by the number Xof pixels in the adjustment region has exceeded a preset threshold A.When the shadow region occupies a large part of the adjustment region,Y/X takes a relatively small value. If Y/X≦the threshold A (equal to orlower than the threshold), the shadow region occupies a large part ofthe adjustment region. Therefore, the bright/dark portion determinationunit 42 outputs the “dark portion determination (Out1)” as thebright/dark portion determination result.

To the contrary, when the non-shadow region occupies a large part of theadjustment region, Y/X takes a relatively large value. Thus, if Y/X>thethreshold A, the process advances to step S4206 in order to executebright/dark portion determination in the second stage.

Subsequently, bright/dark portion determination in the second stage willbe explained. Bright/dark portion determination in the second stage usesthe captured images In3 and In4, as described above. In step S4206, thepattern position specifying unit 43 performs processing of estimatingthe aforementioned intersection point position as a pattern positionwithin the adjustment region in the captured image In3 (captured imageIn4). For example, P1 is a luminance gradation value at a pixel position(x−1, y) in the captured image In3, and P2 is a luminance gradationvalue at a pixel position (x+1, y) in the captured image In3. Q1 is aluminance gradation value at a pixel position (x−1, y) in the capturedimage In4, and Q2 is a luminance gradation value at a pixel position(x+1, y) in the captured image In4. At this time, “if P1>Q1, then P2<Q2”(condition 1) or “if P1<Q1, then P2>Q2” (condition 2) is satisfied, itis determined that the pixel position (x, y) is an intersection pointposition. If neither condition 1 nor 2 is satisfied, it is determinedthat the pixel position (x, y) is not an intersection point position. Inthis manner, whether each pixel position is an intersection pointposition can be determined by performing this condition determinationfor all pixel positions (x, y) within the adjustment region in thecaptured image In3 (captured image In4). In step S4207, the patternposition specifying unit 43 counts, as the “number Z of measurementpixels”, the number of intersection point positions (measurement pixels)estimated in step S4206.

In step S4208, the bright/dark portion determination unit 42 determineswhether a value (ratio of the number Z of the measurement pixels to thenumber Y of pixels in the non-shadow region: equivalent to the detectionamount of measurement pixels) obtained by dividing the number Z of themeasurement pixels by the number Y of pixels in the non-shadow regionhas exceeded a preset threshold B. When the ratio of the number ofintersection point positions to the number of pixels in the non-shadowregion is low, it is considered that not so many intersection pointpositions have been obtained, because the luminance gradation values ofmany pixels in the adjustment region have reached the saturation level.For example, the luminance gradation values of pixels at intersectionpoint positions have exceeded the saturation level near the center inFIG. 6B. As a result, these intersection point positions cannot beobtained, and the Z/Y value becomes relatively small. If Z/Y≦thethreshold B, the bright/dark portion determination unit 42 outputs the“bright portion determination (Out2)” as the bright/dark portiondetermination result. If Z/Y>the threshold B, many intersection pointpositions can be calculated, and the process advances to step S4209.

In step S4209, the bright/dark portion determination unit 42 determines,for each intersection point position, whether the luminance gradationvalue of a pixel at a position near the intersection point position hasbeen saturated. More specifically, the bright/dark portion determinationunit 42 refers to the luminance gradation values of two points on thepositive pattern waveform and two points on the negative patternwaveform, that is, a total of four points (in FIG. 5B, four pointshaving the luminance gradation values PR, PL, NR, and NL) that are closeto the intersection point position. If these four points include one ormore points at which the luminance gradation value becomes equal to orgreater than the saturation level, the pixel at the intersection pointposition is determined as a saturation measurement pixel. Thisprocessing is performed for each obtained intersection point position.In step S4210, the bright/dark portion determination unit 42 counts, asthe “number g of saturation measurement pixels”, the number of pixelsdetermined as saturation measurement pixels in step S4209.

In step S4211, the bright/dark portion determination unit 42 determineswhether a value (ratio of the number g of saturation measurement pixelsto the number Z of measurement pixels) obtained by dividing the “numberg of saturation measurement pixels” by the “number Z of measurementpixels” has exceeded a preset threshold C. If g/Z>the threshold C, thebright/dark portion determination unit 42 outputs the “bright portiondetermination (Out2)” as the bright/dark portion determination result.If g/Z≦the threshold C, the bright/dark portion determination unit 42outputs the “dark portion determination (Out1)” as the bright/darkportion determination result.

As described above, for a highly glossy target object, such as a metal,the luminance gradation value becomes greatly large at a portion atwhich the specular reflection condition is established between incidentlight and reflected light. The mechanism that permits a certain numberof neighboring pixels exceeding the saturation level is introduced insteps S4209 to S4211. Thus, even for a highly glossy target object,bright/dark portion determination can be performed appropriately withoutthe influence of the specular reflection region. As a result, exposureamount adjustment processing functions properly even for a highly glossypart.

Modification

The first embodiment has described a method in which the intersectionpoint position between the positive pattern waveform and the negativepattern waveform in the space encoding method is used to specify apattern position. However, the pattern position specifying method is notlimited to this. For example, the pattern position may be specifiedusing the peak position of the luminance gradation waveform. As patternlight, for example, pattern light formed from a plurality of line beamsshown in FIG. 14 is usable. As the method of obtaining a peak positionfrom the luminance gradation waveform, a method of obtaining thedifference value (differential value) of the luminance gradationwaveform and setting, as a peak position, a position at which thedifference value becomes zero is adopted in many cases.

FIGS. 15A and 15B are graphs in which the abscissa represents the imagecoordinate, and the ordinate represents the luminance gradation value.FIGS. 15A and 15B are enlarged views showing a range near the peakposition. FIGS. 15C and 15D are graphs in which the abscissa representsthe image coordinate, and the ordinate represents the difference valueof the luminance gradation value. The difference value is the differencebetween the luminance gradation values of a pixel of interest and anadjacent pixel.

FIG. 15A shows a luminance gradation waveform that does not exceed thesaturation level, and FIG. 15C shows the waveform of the differencevalue of a corresponding image luminance gradation value. FIG. 15B showsa luminance gradation waveform that exceeds the saturation level, andFIG. 15D shows the waveform of the difference value of a correspondingimage luminance gradation value.

As is apparent from FIG. 15C, the peak position detection result isobtained uniquely. In FIG. 15D, the luminance gradation waveform in FIG.15B is cut at the saturation level, the range in which the differencevalue becomes zero is wide, and the peak position detection result errorbecomes large. Even when the luminance gradation waveform does notexceed the saturation level, the peak position detection accuracybecomes higher as the luminance gradation value becomes larger, becauseof the influence of noise of the image capturing element. That is, evenin the method of specifying the position of pattern light by peakposition detection, a state is desirable, in which the luminancegradation value is adjusted to a level, one step short of the saturationlevel. The outlines of the above-described bright/dark portiondetermination processing and the processing in the adjustment unit areapplicable. Bright/dark portion determination processing in themodification is different from the first embodiment in the followingpoint.

In the first embodiment, the captured images In3 and In4 are necessaryto obtain an intersection point position in the space encoding method.However, in this modification (method using a peak position), only thecaptured image of the target object 5 to which pattern light shown inFIG. 14 has been projected is used. In the processing of step S4206, theposition of a pixel in which the differential value of the luminancegradation value becomes zero in a captured image is specified instead ofthe intersection point position. Subsequent processing is the same asthat in the first embodiment.

Since the exposure amount is adjusted based on the luminance gradationvalue of a pixel used for measurement, the measurement accuracy can beimproved. Also, since the mechanism that permits a certain number ofpixels to exceed the saturation level is further employed, the exposureamount can be adjusted to improve the measurement accuracy of the entireimage even for a highly glossy part.

In the first embodiment, exposure amount adjustment based on a search isexecuted. The search is accompanied by a plurality of times of imagecapturing, and thus, takes time for the exposure amount adjustment, butis effective when there is no knowledge about a target object. Thesearch is also effective when the relationship between the adjustmentparameter and the luminance of a captured image is unclear.

Second Embodiment

An example of the functional arrangement of an image processingapparatus according to the second embodiment will be described withreference to the block diagram of FIG. 10. In FIG. 10, the samereference numerals as those in FIG. 1 denote the same functional units,and a description regarding these functional units will not be repeated.In an arrangement shown in FIG. 10, an appropriate exposure amountcalculation unit 47 replaces the bright/dark portion determination unit42 in the arrangement of FIG. 1.

The appropriate exposure amount calculation unit 47 calculates the nextappropriate exposure amount from an image captured by an image capturingunit 20 in accordance with an initial exposure amount. Unlike the firstembodiment, the second embodiment does not require search, so the timetaken for adjustment is shortened, but the initial exposure amount needsto have been adjusted to a proper range to some extent. In addition, therelationship between the adjustment parameter and the luminancegradation value needs to be grasped. If the exposure time of the imagecapturing unit is an adjustment parameter, the linearity is high so thatwhen the exposure time is doubled, the luminance gradation value of acaptured image is also almost doubled. The exposure time is, therefore,a desirable adjustment parameter to which the embodiment is applied. Theadjustment parameter to which the embodiment is applicable, however, isnot limited to one having high linearity. It is only necessary to findout in advance the relationship between the adjustment parameter and theluminance gradation value. For example, when an LED is used as a lightsource, the relationship between the current value and the luminancegradation value is generally nonlinear. At this time, the relationshipbetween the LED current value and the luminance gradation value ismeasured in advance.

Processing to be performed by an image processing unit 40 according tothe embodiment in order to adjust the exposure amount will be explainedwith reference to FIG. 11 showing the flowchart of this processing. Instep S4121, an adjustment unit 41 sets the initial value (parameter) ofthe exposure amount that has been set in advance or set by the user viaan operation unit (not shown). Assume that the initial exposure amountin the embodiment has been adjusted in advance to a proper range to someextent. For example, exposure amount adjustment according to the firstembodiment is executed in advance and set as the initial exposureamount. In accordance with the initial value of the exposure amount, acaptured image exposure amount control unit 46 controls the exposureamount of the image capturing unit 20. The adjustment unit 41 sets theinitial value (parameter) of the brightness of pattern light that hasbeen set in advance or set by the user via the operation unit (notshown). A pattern light brightness control unit 45 controls thebrightness of pattern light projected from a projection unit 30 inaccordance with the initial value of the brightness of pattern light.

In step S4122, the projection unit 30 sequentially selects one by onepositive and negative patterns, and irradiates a target object 5 withthe selected projection pattern. The image capturing unit 20 capturesthe target object 5. The four-bit space encoding method uses a four-bitpattern. The image capturing unit 20 captures the target object 5 everytime the selected pattern light is projected.

In step S4123, the appropriate exposure amount calculation unit 47 and apattern position specifying unit 43 perform processing of calculating anappropriate exposure amount (parameter) using an image captured by theimage capturing unit 20. Details of the processing in step S4123 will bedescribed later with reference to the flowchart of FIG. 12. In stepS4124, the captured image exposure amount control unit 46 controls, inaccordance with the parameter calculated in step S4123, an exposureamount at the time of image capturing by the image capturing unit 20.

Details of the processing in step S4123 will be described later withreference to the flowchart of FIG. 12. In step S4221, the patternposition specifying unit 43 performs processing of estimating theabove-mentioned intersection point position within an adjustment regionin a captured image In3 (captured image In4) similarly to the processingin step S4206.

In step S4222, the appropriate exposure amount calculation unit 47refers to the luminance gradation values of two points on the positivepattern waveform and two points on the negative pattern waveform, thatis, a total of four points (in FIG. 5B, four points having luminancegradation values PR, PL, NR, and NL) that are close to the intersectionpoint position. A maximum value out of the referred luminance gradationvalues at the four points is set as a luminance gradation value at thisintersection point position. This processing is performed for eachintersection point position.

In step S4223, the appropriate exposure amount calculation unit 47creates the histogram (distribution) of luminance gradation valuesobtained in step S4222 for respective intersection point positions. Instep S4224, the appropriate exposure amount calculation unit 47calculates an exposure amount with which a value obtained by dividing,by the total number of intersection point positions, the number ofintersection point positions (number of pixels) each having a luminancegradation value equal to or larger than the saturation level in thehistogram becomes equal to a specific threshold within a specific range.

The processes in steps S4222 and S4223 will be explained with referenceto FIGS. 13A and 13B. FIG. 13A shows a histogram before adjustment. Notethat the abscissa represents the luminance gradation value, and theordinate represents the number of pixels. The relationship between theluminance gradation value and the adjustment parameter has been graspedin advance. For this reason, an adjustment parameter at which (totalnumber of pixels equal to or higher than the saturation level)/(totalnumber of measurement pixels) threshold is uniquely determined. FIG. 13Bshows a histogram after adjustment. In accordance with the calculatedparameter, the captured image exposure amount control unit 46 controlsan exposure amount at the time of image capturing by the image capturingunit 20.

In the description of the embodiment, only the exposure amount isadjusted. However, the parameter for the projection unit 30 may beadjusted, or both the exposure amount and the parameter for theprojection unit 30 may be adjusted.

Third Embodiment

Each functional unit constituting an image processing unit 40 may beconstituted by hardware or software (computer program). In this case, anapparatus that executes the computer program upon installing thecomputer program is applicable to the image processing unit 40. Anexample of the hardware arrangement of the apparatus applicable to theimage processing unit 40 will be described with reference to the blockdiagram of FIG. 16.

A CPU 1601 controls the operation of the whole apparatus by executingprocessing using computer programs and data stored in a RAM 1602 and ROM1603. In addition, the CPU 1601 executes each processing that isperformed by the image processing unit 40 in the above description.

The RAM 1602 has an area for temporarily storing computer programs anddata loaded from an external storage device 1606, data externallyreceived via an OF (interface) 1607, and the like. Further, the RAM 1602has a work area used when the CPU 1601 executes various processes. Thatis, the RAM 1602 can appropriately provide various areas. The ROM 1603stores, for example, the setting data and boot program of the apparatus.

An operation unit 1604 is constituted by a keyboard, mouse, and thelike. The user of the apparatus can operate the operation unit 1604 toinput various instructions to the CPU 1601. For example, theabove-described adjustment region can be designated by operating theoperation unit 1604.

A display unit 1605 is constituted by a CRT, a liquid crystal display,or the like, and can display the result of processing by the CPU 1601 asan image, a character, or the like. For example, the display unit 1605can display a screen for designating an adjustment region, includingcaptured images In1 and In2.

The external storage device 1606 is a large-capacity information storagedevice typified by a hard disk drive device. The external storage device1606 saves computer programs and data for causing the CPU 1601 toexecute an OS (Operating System), or each processing that is performedby each functional unit in the image processing unit 40 shown in FIG. 1or FIG. 10 in the above description. The data even include informationthat has been explained as known information in the above description.The computer programs and data saved in the external storage device 1606are properly loaded to the RAM 1602 under the control of the CPU 1601,and are processed by the CPU 1601.

The OF 1607 is used when the apparatus communicates with an externaldevice. For example, an image capturing unit 20 or projection unit 30described above can be connected to the OF 1607. All of theabove-mentioned units are connected to a bus 1608.

Fourth Embodiment

An example of the functional arrangement of a target object pickingsystem 508 according to the fourth embodiment will be described withreference to the block diagram of FIG. 17. The target object pickingsystem 508 includes an image processing apparatus (distance measurementapparatus) 501, a target object position and orientation recognitionunit 507 that recognizes the position and orientation of a target object505 by using the result of distance measurement by the image processingapparatus 501, a robot control unit 5062 that controls a robot 5061 byusing the recognition result, and the robot 5061. The robot 5061 is usedto pick the target object 505.

The image processing apparatus 501 includes a projection unit 5030 thatprojects pattern light to the target object 505, an image capturing unit5020 that captures the target object 505 to which the pattern light hasbeen projected, and an image processing unit 5040 that controls theprojection unit 5030 and image capturing unit 5020, and performsdistance measurement with respect to the target object 505 based on thespace encoding method.

First, the projection unit 5030 will be explained. As shown in FIG. 17,the projection unit 5030 includes a light source 5031, an illuminationoptical system 5032, a display element 5033, a projection stop 5034, anda projection optical system 5035.

The light source 5031 is, for example, one of various light emittingelements, such as a halogen lamp and an LED. The illumination opticalsystem 5032 is an optical system having a function of guiding lightemitted by the light source 5031 to the display element 5033. Forexample, an optical system suited to make uniform the luminance, such asKoehler illumination or a diffusion plate, is used. The display element5033 is an element having a function of spatially controlling thetransmittance or reflectance of light traveling from the illuminationoptical system 5032 in accordance with a supplied pattern. For example,a transmission LCD, a reflection LCOS, or a DMD is used. As for supplyof a pattern to the display element 5033, a plurality of types ofpatterns held in the projection unit 5030 may be sequentially suppliedto the display element 5033. Alternatively, a plurality of types ofpatterns held in an external apparatus (for example, the imageprocessing unit 5040) may be sequentially acquired and supplied to thedisplay element 5033. The projection optical system 5035 is an opticalsystem configured to form light (pattern light) guided from the displayelement 5033 into an image at a specific position of the target object505. The projection stop 5034 is used to control the F-number of theprojection optical system 5035.

Next, the image capturing unit 5020 will be explained. As shown in FIG.17, the image capturing unit 5020 includes an image capturing opticalsystem 5023, an image capturing stop 5022, and an image capturingelement 5021. The image capturing optical system 5023 is an opticalsystem configured to image a specific position of the target object 505on the image capturing element 5021. The image capturing stop 5022 isused to control the F-number of the image capturing optical system 5023.The image capturing element 5021 is, for example, one of variousphotoelectric conversion elements such as a CMOS sensor and a CCDsensor. Note that an analog signal photoelectrically converted by theimage capturing element 5021 is sampled and quantized by a control unit(not shown) in the image capturing unit 5020, and is converted into adigital image signal. Further, the control unit generates, from thedigital image signal, an image (captured image), in which each pixel hasa luminance gradation value (density value and pixel value). The controlunit appropriately sends the captured image to a memory in the imagecapturing unit 5020 or to the image processing unit 5040.

Note that the image capturing unit 5020 captures the target object 505every time the projection unit 5030 projects different pattern light.More specifically, the image capturing unit 5020 and projection unit5030 operate synchronously, and the image capturing unit 5020 cancapture the image of the target object 505 to which each differentpattern light has been projected.

Next, the image processing unit 5040 will be explained. As shown in FIG.17, the image processing unit 5040 includes an adjustment unit 5041, arough distance calculation unit 5042, a distance calculation unit 5043,a pattern light brightness control unit 5044, and a captured imageexposure amount control unit 5045.

The adjustment unit 5041 determines parameters for controlling thebright/dark portion of an image to be captured a next time by the imagecapturing unit 5020. The “parameters for controlling the bright/darkportion of an image to be captured a next time by the image capturingunit 5020” include a parameter for the image capturing unit 5020, and aparameter for the projection unit 5030. Both or either of the parametersmay be determined.

The distance calculation unit 5043 acquires an image captured by theimage capturing unit 5020 every time the projection unit 5030 projectseach of a plurality of types of pattern beams. Then, the distancecalculation unit 5043 measures (derives) a distance from the imagecapturing unit 5020 (image capturing optical system 5023) to the targetobject 505 by the triangulation principle using a space code decodedfrom the acquired captured image, and a pattern position specified forthe acquired captured image. The rough distance calculation unit 5042obtains a rough distance from the distance calculated by the distancecalculation unit 5043.

When the adjustment unit 5041 determines the “parameter for theprojection unit 5030”, the pattern light brightness control unit 5044controls the brightness of pattern light projected from the projectionunit 5030 in accordance with the parameter. The method of controllingthe brightness of pattern light includes, for example, the followingthree methods.

The first method is to control the emission luminance of the lightsource 5031. In the case of a halogen lamp, when the application voltageis increased, the emission luminance increases. In the case of an LED,when a current to be supplied is increased, the emission luminanceincreases. In this case, the “parameter for the projection unit 5030” isa parameter for controlling the emission luminance of the light source5031.

The second method is to control the display gradation value of thedisplay element 5033. In the case of an LCD, when the display gradationvalue is increased, the transmittance increases, and pattern lightbecomes bright. In the case of an LCOS, when the display gradation valueis increased, the reflectance increases, and pattern light becomesbright. In the case of a DMD, when the display gradation value isincreased, the ON count per frame increases, and pattern light becomesbright. In this case, the “parameter for the projection unit 5030” is aparameter for controlling the display gradation value of the displayelement 5033.

The third method is to control the projection stop 5034. When the stopis opened, pattern light becomes bright. To the contrary, when the stopis narrowed, pattern light becomes dark. When controlling the projectionstop 5034, the depth of field of the projection optical system alsochanges, so this influence needs to be considered. More specifically,the resolution of pattern light is evaluated at each projection stopbased on an index, such as the contrast of the image luminance waveform,and it is checked whether serious accuracy degradation will occur whenperforming distance measurement. In this case, the “parameter for theprojection unit 5030” is a parameter for controlling the projection stop5034.

When the adjustment unit 5041 determines the “parameter for the imagecapturing unit 5020”, the captured image exposure amount control unit5045 controls, in accordance with the parameter, an exposure amount atthe time of image capturing by the image capturing unit 5020, therebycontrolling the luminance gradation value of a captured image. Themethod of controlling the exposure amount of the image capturing unit5020 includes, for example, the following three methods.

The first method is to control the exposure time (shutter speed) of theimage capturing element 5021. When the exposure time is prolonged, theluminance gradation value of a captured image increases. In contrast,when the exposure time is shortened, the luminance gradation valuedecreases. In this case, the “parameter for the image capturing unit5020” is a parameter for controlling the exposure time (shutter speed)of the image capturing element 5021.

The second method is to control the image capturing stop 5022. When thestop is opened, the luminance gradation value of a captured imageincreases. Conversely, when the stop is narrowed, the luminancegradation value of a captured image decreases. When controlling theimage capturing stop 5022, the depth of field of the image capturingoptical system also changes, so this influence needs to be considered.More specifically, the resolution of pattern light is evaluated at eachimage capturing stop based on an index such as the contrast of the imageluminance waveform, and it is checked whether serious accuracydegradation will occur when performing distance measurement. In thiscase, the “parameter for the image capturing unit 5020” is a parameterfor controlling the image capturing stop 5022.

The third method is to project the same pattern a plurality of times, tocapture images, and to add image luminance values (composite capturedimages every time the pattern is projected). In the method of prolongingthe exposure time, image saturation occurs owing to the dynamic range ofthe sensor. However, in the above-described method of projecting thesame pattern a plurality of times, and generating one composite image byadding respective images captured in every projection, the exposureamount can be increased while preventing image saturation. In acomposite image obtained by this method, the noise component of theimage capturing element is reduced. More specifically, letting σb be thenoise amount of the image capturing element at the time of capturing oneimage, a noise amount generated when images are captured N times andadded is σb/√N. Although images are captured a plurality of times andadded in the above description, the same effect can be obtained even bya method of calculating the average image of images captured a pluralityof times.

The target object 505 is a set of target objects piled at random.

The target object position and orientation recognition unit 507recognizes the position and orientation of the target object 505 (inpractice, each target object observable from the image capturing unit5020, out of the target object 505) in a coordinate system (robotcoordinate system) handled by the robot 5061 by using the result ofdistance measurement by the image processing apparatus 501. As theposition and orientation recognition method, various known recognitionmethods can be employed. For example, a method of recognizing theposition and orientation of a target object by matching processingbetween a CAD model and 3D point group data based on the distancemeasurement result may be adopted.

Note that the target object position and orientation recognition unit507 may be a unit in the image processing apparatus 501, or an apparatusseparate from the image processing apparatus 501. In any case, thetarget object position and orientation recognition unit 507 may take anyform as long as it can recognize the position and orientation of thetarget object 505 from the result of distance measurement by the imageprocessing apparatus 501, and send the recognized position andorientation to the robot control unit 5062.

The robot control unit 5062 controls the robot 5061 in accordance withthe position and orientation recognized by the target object positionand orientation recognition unit 507, and causes the robot 5061 to pickthe target object whose position and orientation have been recognized.The picked target object is carried to the next step. As target objectsare picked, the height of the pile gradually decreases. Along with this,the distance from the image capturing unit 5020 increases.

Although distance measurement is performed based on the space encodingmethod in the embodiment, as described above, there are a plurality ofderivative forms for the space encoding method. The embodiment adopts amethod disclosed in Japanese Patent Laid-Open No. 2011-47931. Theprinciple of this method has been described with reference to FIGS. 2Ato 5B. The method is the same as that in the first embodiment, unlessotherwise specified.

Assuming that many components of noise σ are shot noise, the brightnessof pattern light or the exposure amount in the image capturing unit 5020needs to be multiplied by n2 in order to reduce the error to 1/n. Forexample, to reduce the error to one half, the brightness of patternlight or the exposure amount in the image capturing unit 5020 isquadrupled. When the exposure amount is quadrupled, (DL+DR) of thedenominator is quadrupled. When the exposure amount is quadrupled, thenoise σ as the numerator becomes √4, that is, double, because it isproportional to the value of the square root of the image luminancegradation value. Since the numerator becomes double and the denominatorbecomes quadruple, the error becomes one half.

In a case in which, of a plurality of piled parts (target object 505), apart whose position and orientation have been recognized is picked, theheight of the pile changes as the part is removed, as shown in FIGS. 18Ato 18C. When the height of the pile is high, the distance from the imagecapturing unit 5020 to an image capturing target becomes short, as shownin FIG. 18A. When the height of the pile is low, the distance from theimage capturing unit 5020 to an image capturing target becomes long, asshown in FIG. 18C. At this time, the luminance value of a part in animage captured by the image capturing unit 5020 decreases in proportionto the square of the distance from the image capturing unit 5020 to theimage capturing target.

The relationship between a luminance value in an image captured by theimage capturing unit 5020, and a distance from the image capturing unit5020 to an image capturing target will be explained with reference toFIGS. 19A to 19C. Assume that the exposure amount of the image capturingunit 5020 has been set to be optimum at a distance Zm (middle distance)from the image capturing unit 5020 to the image capturing target, asshown in FIG. 19B. In FIG. 19B, the waveform of a full light-on patternand the waveforms of positive and negative patterns partially exceed thesaturation level, but a luminance gradation value near an intersectionpoint position used to specify a pattern position does not exceed thesaturation level. For this reason, the intersection point position canbe specified, and the sub-pixel position estimation error can bereduced, because the luminance gradation value near the intersectionpoint becomes large.

FIG. 19A shows the waveforms of luminance gradation values when thedistance from the image capturing unit 5020 to an image capturing targetis Zn (short distance) less than Zm. The waveforms exceed the saturationlevel at the center. FIG. 19A shows the waveforms exceeding thesaturation level, for convenience. In practice, a waveform exceeding thesaturation level is cut at the luminance gradation value of thesaturation level and output. In FIG. 19A, the intersection pointposition is cut at the luminance gradation value of the saturationlevel, and cannot be specified.

FIG. 19C shows the waveforms of luminance gradation values when thedistance from the image capturing unit 5020 to an image capturing targetis Zf (long distance) greater than Zm. In the state of FIG. 19C, none ofthe waveforms of the luminance gradation values reaches the saturationlevel, and the distance measurement accuracy is low.

From the above description, to reliably perform distance measurement athigh accuracy at a short distance, a middle distance, and a longdistance, “parameters for controlling the bright and dark portions of animage to be captured a next time by the image capturing unit 5020” needto be adjusted in accordance with the distance.

Next, processing to be performed by the image processing unit 5040 inorder to adjust the exposure amount (exposure time) of the imagecapturing unit 5020 will be explained with reference to FIG. 20, showingthe flowchart of this processing. The processing complying with theflowchart of FIG. 20 includes processing (step S50100) of obtaining anexposure amount serving as a reference (reference exposure amount), anda distance (reference distance) measured using an image captured in thereference exposure amount, and processing (step S50110) of adjusting theexposure amount.

First, the processing in step S50100 will be explained. In step S50101,the captured image exposure amount control unit 5045 controls theexposure amount of the image capturing unit 5020 in accordance with thecurrently set parameter of the exposure amount. The pattern lightbrightness control unit 5044 controls the brightness of pattern lightprojected from the projection unit 5030 in accordance with the currentlyset parameter of the brightness of pattern light.

In step S50101, the projection unit 5030 sequentially selects one by onea plurality of projection patterns described above, and irradiates thetarget object 505 with the selected projection pattern. The imagecapturing unit 5020 captures the target object 505. The types ofprojection patterns are four: a full light-on pattern, a full light-offpattern, a positive pattern (in FIGS. 2A to 2G, the four positivepatterns in FIGS. 2C to 2F), and a negative pattern (in FIGS. 2A to 2G,the negative pattern in FIG. 2G). The four-bit space encoding methoduses a four-bit positive pattern as the positive pattern, and a four-bitnegative pattern as the negative pattern. The image capturing unit 5020captures the target object 505 every time the selected pattern light isprojected.

In step S50102, the adjustment unit 5041 performs bright/dark portiondetermination using the image captured by the image capturing unit 5020.Details of the processing in step S50102 are the same as those of theprocessing complying with the flowchart of FIG. 9 (the adjustment unit5041 executes the processing complying with the flowchart of FIG. 9instead of the bright/dark portion determination unit 42), so adescription thereof will not be repeated.

Note that the bright/dark portion determination processing for acaptured image that is performed in step S50102 is not limited to theprocessing complying with the flowchart of FIG. 9, but may adopt anothermethod.

In step S50103, if the determination result in step S50102 is “brightportion”, the adjustment unit 5041 adjusts the parameter of the imagecapturing unit 5020 in order to adjust the current exposure amount ofthe image capturing unit 5020 to be lesser (in order to adjust thecurrent exposure time to be shorter). If the determination result instep S50102 is “dark portion”, the adjustment unit 5041 adjusts theparameter of the image capturing unit 5020 in order to adjust thecurrent exposure amount of the image capturing unit 5020 to be greater(in order to adjust the current exposure time to be longer). Theexposure time can be adjusted by, for example, binary search. Theadjustment unit 5041 sets, in the captured image exposure amount controlunit 5045, the adjusted parameter of the image capturing unit 5020. Thecaptured image exposure amount control unit 5045 controls the imagecapturing unit 5020 in accordance with the adjusted parameter from thenext time.

After that, the process returns to step S50101. In step S50101, imagecapturing based on the exposure time adjusted in step S50103 isperformed. In this way, the processes in steps S50101 to S50103 arerepetitively performed a plurality of times. In step S50104, theadjustment unit 5041 obtains, as a reference exposure amount Exb, anexposure amount (in this case, exposure time) obtained as a result ofthe repetition.

In step S50105, the captured image exposure amount control unit 5045controls the exposure amount of the image capturing unit 5020 inaccordance with the reference exposure amount Exb. The pattern lightbrightness control unit 5044 controls the brightness of pattern lightprojected from the projection unit 5030 in accordance with the currentlyset parameter of the brightness of pattern light. The projection unit5030 sequentially selects, one by one, a plurality of projectionpatterns described above, and irradiates the target object 505 with theselected projection pattern. The image capturing unit 5020 captures thetarget object 505. By performing the above-described processing usingeach image captured by the image capturing unit 5020, the distancecalculation unit 5043 measures distances to respective target objects inthe captured image.

In step S50106, the rough distance calculation unit 5042 obtains areference distance (reference rough distance) Zb serving as the typicaldistance of the distances to the respective target objects in thecaptured image. Processing for obtaining the reference distance Zb fromdistances to respective target objects in a captured image will beexplained with reference to FIGS. 21A and 21B. FIG. 21A shows an exampleof the reference distance Zb when the height of the pile is high. FIG.21B shows an example of the reference distance Zb when the height of thepile is middle. For example, the average distance of distances torespective target objects in a captured image may be set as thereference distance, or a maximum value, a minimum value, a median value,or the like, may be employed as the reference distance.

Next, the processing in step S50110 will be explained. In step S50111,the captured image exposure amount control unit 5045 controls theexposure amount of the image capturing unit 5020 in accordance with thecurrently set exposure amount (in step S50111 for the first time, thereference exposure amount Exb, and in step S50111 for the second andsubsequent times, an exposure amount Ext adjusted in previous stepS50116). The pattern light brightness control unit 5044 controls thebrightness of pattern light projected from the projection unit 5030 inaccordance with the currently set parameter of the brightness of patternlight. The projection unit 5030 sequentially selects, one by one, aplurality of projection patterns described above, and irradiates thetarget object 505 with the selected projection pattern. The imagecapturing unit 5020 captures the target object 505.

By performing the above-described processing using each image capturedby the image capturing unit 5020, the distance calculation unit 5043measures distances to respective target objects in the captured image instep S50112.

In step S50113, the rough distance calculation unit 5042 performs thesame processing as that in step S50106 described above, therebyobtaining a typical distance (rough distance) Zt of the distances to therespective target objects in the captured image.

In step S50114, the adjustment unit 5041 obtains a currently setadjustment amount (optical correction amount) Czo of the exposure amountby using the reference distance Zb and distance Zt. The opticalcorrection amount Czo is calculated based on an optical characteristicin which the luminance value in an image becomes dark in proportion tothe square of the distance. More specifically, the optical correctionamount Czo is obtained by solving:Czo=(Zt/Zb)²  (3)

In step S50115, the adjustment unit 5041 adjusts the reference exposureamount Exb by using the optical correction amount Czo. For example, thereference exposure amount Exb is adjusted according to:Czo×Exb→Ext.  (4)

In step S50116, the adjustment unit 5041 sets, in the captured imageexposure amount control unit 5045, the exposure amount Ext adjusted instep S50115. The process then returns to step S50111 to repeat thesubsequent processes.

As described above, according to the fourth embodiment, the exposureamount is set to be small in a case in which the height of the pile ishigh, and to be large in a case in which the height of the pile is low.An appropriate exposure amount can be set in accordance with the heightof the pile. That is, the luminance value of a captured image can bekept almost constant with respect to a change of the height of the pile.

In the fourth embodiment, distance measurement with respect to thetarget object 505 is performed based on the space encoding method.However, distance measurement with respect to the target object 505 maybe executed by another method. For example, a distance measurementmethod based on various pattern projections, such as a light-sectionmethod and phase shift method, may be adopted.

Fifth Embodiment

In the fifth embodiment, the exposure amount is adjusted inconsideration of, not only the optical correction amount, but also, atriangulation error. A difference from the fourth embodiment will bemainly explained, and the remaining part is the same as that in thefourth embodiment, unless otherwise specified.

Processing to be performed by an image processing unit 5040 in order toadjust the exposure amount of an image capturing unit 5020 will beexplained with reference to FIG. 22 showing the flowchart of thisprocessing. In the flowchart of FIG. 22, the same step numbers as thosein FIG. 20 denote the same processing steps, and a description of theseprocessing steps will not be repeated.

In step S50215, an adjustment unit 5041 obtains an adjustment amount(triangulation correction amount) Czt of the triangulation error byusing a reference distance Zb and distance Zt. The correction amount iscalculated based on a characteristic in which the triangulation errorincreases in proportion to the square of the distance. As the distanceis multiplied by n, the distance measurement error is multiplied by n²,as shown in FIG. 23. To keep the measurement error constant, a sub-pixelposition estimation error ΔC needs to be 1/n². To set the sub-pixelestimation error ΔC to be 1/n², the brightness of pattern light or theexposure amount needs to be multiplied by n⁴, as described above. Cztcan be obtained according to:Czt=(Zt/Zb)⁴  (5)

In step S50216, the adjustment unit 5041 adjusts the reference exposureamount Exb by using the optical correction amount Czo and triangulationcorrection amount Czt. For example, the reference exposure amount Exb isadjusted according to:Czo×Czt×Exb→Ext.  (6)

In step S50217, the adjustment unit 5041 sets, in a captured imageexposure amount control unit 5045, the exposure amount Ext adjusted instep S50216. The process then returns to step S50111 to repeat thesubsequent processes.

Note that, when the ratio of the reference distance Zb and distance Ztis high, if the exposure amount Ext=the exposure time and the exposuretime is multiplied by (Czo×Czt), a captured image may be saturated. Inthis case, the exposure time out of Ext is multiplied by the opticalcorrection amount Czo, and the number of images to be captured ismultiplied by Czt. This can reduce the measurement error withoutsaturating a captured image.

As described above, according to the fifth embodiment, the exposureamount is set to be small in a case in which the height of the pile ishigh, and to be large in a case in which the height of the pile is low.An appropriate exposure amount can be set in accordance with the heightof the pile. That is, the luminance value of a captured image can bekept almost constant with respect to a change of the height of the pile.Since even the triangulation error is taken into account, the brightnessof a captured image and the measurement error can be kept almostconstant with respect to a change of the height of the pile.

Sixth Embodiment

An example of the functional arrangement of a target object pickingsystem 508 according to the sixth embodiment will be described withreference to the block diagram of FIG. 24. In FIG. 24, the samereference numerals as those in FIG. 17 denote the same functional units,and a description regarding these functional units will not be repeated.The arrangement shown in FIG. 24 is different from the arrangement ofFIG. 17 in that a position and orientation recognized by a target objectposition and orientation recognition unit 507 are supplied, not only toa robot control unit 5062, but also, to an adjustment unit 5041.

The sixth embodiment considers, not only a change of the light amountupon a change of the distance to a target object, but also, a change ofthe light amount caused by light falloff at edges. For this purpose, theadjustment unit 5041 needs to grasp the position of a target object in acaptured image (in other words, the angle of view with respect to arange in which the target object exists). To grasp the position of atarget object in a captured image, an output result from the targetobject position and orientation recognition unit 507 is used.

A difference from the fourth embodiment will be mainly explained, andthe remaining part is the same as that in the fourth embodiment, unlessotherwise specified. First, the relationship between the position andorientation of a target object, and the angle θ of view with respect tothe target object will be described with reference to FIG. 25. Assumethat the position of the target object that is output from the targetobject position and orientation recognition unit 507 is (Xr, Yr, Zr). Acoordinate origin O is set to coincide with the origin of a coordinatesystem handled by an image processing unit 5040. Letting r be thedistance from the Z-axis to the target object in an X-Y plane at a depthZr, r is calculated by:r=√(Xr ² +Yr ²).  (7)

The angle θ of view can be calculated using r and Zr:θ=tan⁻¹(r/Zr).  (8)

That is, the relationship between the position (Xr, Yr, Zr) of thetarget object and the angle θ of view can be grasped from equation (8).

Next, processing to be performed by the image processing unit 5040 inorder to adjust the exposure amount of an image capturing unit 5020 willbe explained with reference to FIG. 26 showing the flowchart of thisprocessing (processing to be executed by the target object position andorientation recognition unit 507 is also partially included). Theprocessing complying with the flowchart of FIG. 26 includes processing(step S50300) of obtaining a reference exposure amount Exb, referencedistance Zb, and reference plane internal position θb, and processing(step S50310) of adjusting the exposure amount for each target object.

First, details of the processing in step S50300 will be explained withreference to the flowcharts of FIGS. 27A and 27B. Both the flowchartshown in FIG. 27A and the flowchart shown in FIG. 27B are the flowchartsof processes applicable to step S50300. In FIGS. 27A and 27B, the samestep numbers as those shown in FIG. 20 denote the same processing steps,and a description of these processing steps will not be repeated.

First, processing complying with the flowchart of FIG. 27A will beexplained.

In step S50306, a captured image exposure amount control unit 5045controls the exposure amount of the image capturing unit 5020 inaccordance with the reference exposure amount Exb. A pattern lightbrightness control unit 5044 controls the brightness of pattern lightprojected from a projection unit 5030 in accordance with the currentlyset parameter of the brightness of pattern light. The projection unit5030 sequentially selects, one by one, a plurality of projectionpatterns described above, and irradiates a target object 505 with theselected projection pattern. The image capturing unit 5020 captures thetarget object 505. By performing the above-described processing usingeach image captured by the image capturing unit 5020, a distancecalculation unit 5043 measures distances to respective target objects inthe captured image.

The target object position and orientation recognition unit 507recognizes the positions and orientations of the target objects by usingthe distances to the respective target objects that have been calculatedby the distance calculation unit 5043. The adjustment unit 5041 acquiresthe positions (Xr, Yr, Zr) of the respective target objects recognizedby the target object position and orientation recognition unit 507.

In step S50307, the adjustment unit 5041 sets the position Zr of thetarget object as the reference distance Zb for the respective targetobjects in the captured image.

In step S50308, the adjustment unit 5041 calculates the reference planeinternal position θb for the respective target objects in the capturedimage based on equations (7) and (8) by:θb=tan⁻¹(√(Xr ² +Yr ²)/Zr).  (9)

Next, processing complying with the flowchart of FIG. 27B will beexplained. In FIG. 27B, the rough distance of the entire pile is thereference rough distance Zb, and the center (position at which the angleof view is 0°) of a captured image is the reference angle θb of view. Instep S50308′, the adjustment unit 5041 sets, to zero, the referenceplane internal position θb common to respective target objects in acaptured image.

Next, details of the processing in step S50310 will be described withreference to FIG. 28 showing the flowchart of this processing. In FIG.28, the same step numbers as those shown in FIG. 20 denote the sameprocessing steps, and a description regarding these processing stepswill not be repeated.

In step S50313, the target object position and orientation recognitionunit 507 recognizes the position and orientation of each target objectby using a distance calculated by the distance calculation unit 5043 forthe target object in an image captured in step S50111. At this time, thetarget object position and orientation recognition unit 507 sends, tothe robot control unit 5062, the position of a target object (candidate1) that has been output to the adjustment unit 5041 previously. Also,the target object position and orientation recognition unit 507 outputs,to the adjustment unit 5041, the position of one target object(candidate 2) that has not been output yet. In addition to the position,the orientation may be output to the robot control unit 5062.

In the first output by the target object position and orientationrecognition unit 507, there is no target object corresponding tocandidate 1. Thus, a target object having a smallest position Zr out ofthe positions of respective recognized target objects is set ascandidate 1.

For example, assume that the target object position and orientationrecognition unit 507 recognizes the position and orientation of targetobject 1, the position and orientation of target object 2, the positionand orientation of target object 3, and the position and orientation oftarget object 4. Also, assume that position Zr of target object 3 issmallest among positions Zr of target objects 1 to 4. At the first time,the target object position and orientation recognition unit 507 outputsthe position (may also output the orientation) of target object 3serving as candidate 1 to the robot control unit 5062, and outputs theposition of target object 1 serving as candidate 2 to the adjustmentunit 5041. At the second time, the target object position andorientation recognition unit 507 outputs the position (may also outputthe orientation) of target object 1 serving as candidate 1 to the robotcontrol unit 5062, and outputs the position of target object 2 servingas candidate 2 to the adjustment unit 5041. At the third time, thetarget object position and orientation recognition unit 507 outputs theposition (may also output the orientation) of target object 2 serving ascandidate 1 to the robot control unit 5062, and outputs the position oftarget object 3 serving as candidate 2 to the adjustment unit 5041. Atthe fourth time, the target object position and orientation recognitionunit 507 outputs the position (may also output the orientation) oftarget object 3 serving as candidate 1 to the robot control unit 5062,and outputs the position of target object 4 serving as candidate 2 tothe adjustment unit 5041. At the fifth time, the target object positionand orientation recognition unit 507 outputs the position of targetobject 4 to the robot control unit 5062.

In this manner, the position of the second candidate is output to theadjustment unit 5041. A target object that was previously the secondcandidate is set as the first candidate this time. Then, the position ofthe first candidate time this is output (the orientation may also beoutput) to the robot control unit 5062.

In step S50314, upon receiving the position (Xr2, Yr2, Zr2) of thesecond candidate, the adjustment unit 5041 sets Zr2 in the roughdistance Zt.

In step S50315, the adjustment unit 5041 obtains an optical correctionamount Czo by solving the above-described equation (3) using thereference distance Zb and rough distance Zt.

In step S50316, the adjustment unit 5041 obtains a triangulationcorrection amount Czt by solving the above-described equation (5) usingthe reference distance Zb and rough distance Zt.

In step S50317, the adjustment unit 5041 obtains an angle θr of viewwith respect to the second candidate by solving the above-describedequation (9) using the position (Xr2, Yr2, Zr2) of the second candidate.

In step S50319, the adjustment unit 5041 obtains an angle-of-viewcorrection amount Cθ by solving equation (10) using the reference planeinternal position θb calculated in step S50300 (or step S50300′)described above, and the angle θr of view obtained in step S50317:Cθ=cos⁴ θb/cos⁴ θr.  (10)

It is known that light falloff occurs based on a so-called cosinefourth-power law. According to this law, light falloff occurs inproportion to the fourth power of the cosine.

In step S50319, the adjustment unit 5041 adjusts the reference exposureamount Exb by solving expression (11), and obtains the exposure amountExt for the second candidate as the result of adjustment:Czo×Czt×Cθ×Exb→Ext.  (11)

That is, every time the adjustment unit 5041 receives the position ofthe second candidate, it calculates Ext for the second candidate.According to the embodiment, even if the position of a target object tobe recognized in the frame changes in addition to the height of thepile, an appropriate exposure amount can be set. The exposure amount isset to be small near the center of the frame at which the angle of viewis small, and to be large at the edge of the frame at which the angle ofview is large.

The embodiment has described an example in which the position of atarget object in a captured image is grasped based on the position andorientation recognition result of the target object. However, theposition and orientation recognition result of a target object need notalways be used. For example, an area in which a target object iscaptured in a captured image is divided into a plurality of areas, and arough distance is calculated for each divided area. The center positionof an area having a smallest rough distance among the divided areas isregarded as a position at which the target object exists.

In step S50318 described above, light falloff at edges depending on theposition (angle of view) in a captured image is formulated on theassumption that it is based on the cosine fourth-power law. However, thepresent invention is not limited to this. When the characteristic of theoptical system is not based on the cosine fourth-power law, a properequation can be used in accordance with this characteristic.Alternatively, it is also possible to use a method of tabling therelationship between the angle of view and the brightness based onmeasured data without using a polynomial, and refer to the value of acorresponding angle of view in accordance with the position of a targetobject in a captured image.

Seventh Embodiment

Each functional unit constituting an image processing unit 5040 may beconstituted by hardware or software (computer program). In this case, anapparatus that executes the computer program upon installing thecomputer program is applicable to the image processing unit 5040. As anexample of the hardware arrangement of the apparatus applicable to theimage processing unit 5040, for example, the arrangement shown in theblock diagram of FIG. 16 is applicable.

OTHER EMBODIMENTS

Embodiment(s) of the present invention can also be realized by acomputer of a system or an apparatus that reads out and executescomputer executable instructions (e.g., one or more programs) recordedon a storage medium (which may also be referred to more fully asanon-transitory computer-readable storage medium′) to perform thefunctions of one or more of the above-described embodiment(s) and/orthat includes one or more circuits (e.g., an application specificintegrated circuit (ASIC)) for performing the functions of one or moreof the above-described embodiment(s), and by a method performed by thecomputer of the system or an apparatus by, for example, reading out andexecuting the computer executable instructions from the storage mediumto perform the functions of one or more of the above-describedembodiment(s) and/or controlling the one or more circuits to perform thefunctions of one or more of the above-described embodiment(s). Thecomputer may comprise one or more processors (e.g., a central processingunit (CPU), a micro processing unit (MPU)) and may include a network ofseparate computers or separate processors to read out and to execute thecomputer executable instructions. The computer executable instructionsmay be provided to the computer, for example, from a network or thestorage medium. The storage medium may include, for example, one or moreof a hard disk, a random-access memory (RAM), a read only memory (ROM),a storage of distributed computing systems, an optical disk (such as acompact disc (CD), a digital versatile disc (DVD), or a Blu-ray Disc(BD)™) a flash memory device, a memory card, and the like.

While the present invention has been described with reference toexemplary embodiments, it is to be understood that the invention is notlimited to the disclosed exemplary embodiments. The scope of thefollowing claims is to be accorded the broadest interpretation so as toencompass all such modifications and equivalent structures andfunctions.

What is claimed is:
 1. A processing apparatus comprising: an acquisitionunit configured to acquire a single captured image obtained bycapturing, by an image capturing unit, target objects to which aprojection unit has emitted pattern light; a derivation unit configuredto derive, using the single captured image, distances from the imagecapturing unit to the target objects included in the single capturedimage; and an adjustment unit configured to obtain, using the deriveddistances, an adjustment amount of at least one of a brightness of thepattern light emitted from the projection unit and an exposure amount ofthe image capturing unit, and to adjust, in accordance with the obtainedadjustment amount, at least one of a first parameter for controlling thebrightness of the pattern light emitted from the projection unit, and asecond parameter for controlling the exposure amount of the imagecapturing unit.
 2. The apparatus according to claim 1, furthercomprising: a first unit configured to adjust at least one of the firstparameter and the second parameter in accordance with a luminance of thecaptured image; and a second unit configured to acquire, afteradjustment by the first unit, a captured image obtained by capturing, bythe image capturing unit in which the second parameter has been set, atarget object to which pattern light has been emitted by the projectionunit in which the first parameter has been set, and to calculate, as areference distance, a distance from the image capturing unit to thetarget object by using the acquired captured image, wherein theadjustment unit adjusts at least one of the first parameter and thesecond parameter by using a ratio of the distance derived by thederivation unit to the reference distance.
 3. The apparatus according toclaim 2, wherein the adjustment unit adjusts an adjustment target out ofthe first parameter and the second parameter by multiplying theadjustment target by a value obtained by squaring the ratio.
 4. Theapparatus according to claim 2, wherein the adjustment unit adjusts thesecond parameter by multiplying, by a value obtained by squaring theratio, a parameter included in the second parameter to control anexposure time, and multiplying, by a value obtained by raising the ratioto the fourth power, a parameter included in the second parameter tocontrol an image capturing count.
 5. The apparatus according to claim 1,wherein the adjustment unit adjusts at least one of the first parameterand the second parameter in accordance with the distance and a positionof the target object.
 6. The apparatus according to claim 2, wherein (i)the first unit obtains an intersection point between a luminance valuewaveform formed from luminance values of respective pixels constitutinga first captured image of the target object to which first pattern lighthas been emitted, and a luminance value waveform formed from luminancevalues of respective pixels constituting a second captured image of thetarget object to which second pattern light obtained by inverting brightand dark portions in the first pattern light has been emitted, and (ii)the first unit adjusts at least one of the first parameter and thesecond parameter in accordance with the number of intersection points.7. The apparatus according to claim 6, wherein, when a ratio of thenumber of intersection points to the number of pixels in a regionspecified as a non-shadow region in the first captured image or thesecond captured image is not higher than a threshold, the first unitadjusts the first parameter to make the pattern light darker, or adjuststhe second parameter to decrease the exposure amount.
 8. The apparatusaccording to claim 6, wherein, when a ratio of the number ofintersection points to the number of pixels in a region specified as anon-shadow region in the first captured image or the second capturedimage is not higher than a threshold, the first unit adjusts the firstparameter to make the pattern light darker, and adjusts the secondparameter to decrease the exposure amount.
 9. The apparatus according toclaim 6, wherein (i) when a ratio of the number of intersection pointsto the number of pixels in a region specified as a non-shadow region inthe first captured image or the second captured image has exceeded athreshold, the first unit obtains, as a second ratio, a ratio, to thenumber of intersection points, of the number of intersection pointsobtained by referring to pixels whose pixel values are saturated, and(ii) when the second ratio has exceeded a threshold, the first unitadjusts the first parameter to make the pattern light darker, or adjuststhe second parameter to decrease the exposure amount.
 10. The apparatusaccording to claim 6, wherein (i) when a ratio of the number ofintersection points to the number of pixels in a region specified as anon-shadow region in the first captured image or the second capturedimage has exceeded a threshold, the first unit obtains, as a secondratio, a ratio, to the number of intersection points, of the number ofintersection points obtained by referring to pixels whose pixel valuesare saturated, and (ii) when the second ratio has exceeded a threshold,the first unit adjusts the first parameter to make the pattern lightdarker, and adjusts the second parameter to decrease the exposureamount.
 11. The apparatus according to claim 6, wherein (i) when a ratioof the number of intersection points to the number of pixels in a regionspecified as a non-shadow region in the first captured image or thesecond captured image has exceeded a threshold, the first unit obtains,as a second ratio, a ratio, to the number of intersection points, of thenumber of intersection points obtained by referring to pixels whosepixel values are saturated, and (ii) when the second ratio is not higherthan a threshold, the first unit adjusts the first parameter to make thepattern light brighter, or adjusts the second parameter to increase theexposure amount.
 12. The apparatus according to claim 6, wherein (i)when a ratio of the number of intersection points to the number ofpixels in a region specified as a non-shadow region in the firstcaptured image or the second captured image has exceeded a threshold,the first unit obtains, as a second ratio, a ratio, to the number ofintersection points, of the number of intersection points obtained byreferring to pixels whose pixel values are saturated, and (ii) when thesecond ratio is not higher than a threshold, the first unit adjusts thefirst parameter to make the pattern light brighter, and adjusts thesecond parameter to increase the exposure amount.
 13. A processingmethod to be performed by an image processing apparatus, the methodcomprising: acquiring a single captured image obtained by capturing, byan image capturing unit, target objects to which a projection unit hasemitted pattern light; deriving distances, using the single capturedimage, from the image capturing unit to the target objects included inthe single captured image; and obtaining, using the derived distances,an adjustment amount of at least one of a brightness of the patternlight emitted from the projection unit and an exposure amount of theimage capturing unit, and adjusting, in accordance with the obtainedadjustment amount, at least one of a first parameter for controlling thebrightness of the pattern light emitted from the projection unit, and asecond parameter for controlling the exposure amount of the imagecapturing unit.
 14. A non-transitory computer-readable storage mediumstoring a computer program for causing a computer to function as: anacquisition unit configured to acquire a single captured image obtainedby capturing, by an image capturing unit, target objects to which aprojection unit has emitted pattern light; a derivation unit configuredto derive, using the single captured image, distances from the imagecapturing unit to the target objects included in the single capturedimage; and an adjustment unit configured to obtain, using the deriveddistances, an adjustment amount of at least one of a brightness of thepattern light emitted from the projection unit and an exposure amount ofthe image capturing unit, and to adjust, in accordance with the obtainedadjustment amount, at least one of a first parameter for controlling thebrightness of the pattern light emitted from the projection unit, and asecond parameter for controlling the exposure amount of the imagecapturing unit.
 15. A measurement apparatus comprising: (a) a projectionunit configured to emit pattern light to target objects; (b) an imagecapturing unit configured to capture the target objects to which theprojection unit has emitted the pattern light; and (c) a processingapparatus comprising: (i) an acquisition unit configured to acquire asingle captured image of the target objects captured by the imagecapturing unit; (ii) a derivation unit configured to derive, using thesingle captured image, distances from the image capturing unit to thetarget objects included in the single captured image; and (iii) anadjustment unit configured to obtain, using the derived distances, anadjustment amount of at least one of a brightness of the pattern lightemitted from the projection unit and an exposure amount of the imagecapturing unit, and to adjust, in accordance with the obtainedadjustment amount, at least one of a first parameter for controlling thebrightness of the pattern light emitted from the projection unit and asecond parameter for controlling the exposure amount of the imagecapturing unit.
 16. A system comprising: a measurement apparatuscomprising: (a) a projection unit configured to emit pattern light totarget objects; (b) an image capturing unit configured to capture thetarget objects to which the projection unit has emitted the patternlight; and (c) a processing apparatus comprising: (i) an acquisitionunit configured to acquire a single captured image of the target objectscaptured by the image capturing unit; (ii) a derivation unit configuredto derive, using the single captured image, distances from the imagecapturing unit to the target objects included in the single capturedimage; and (iii) an adjustment unit configured to obtain, using thederived distances, an adjustment amount of at least one of a brightnessof the pattern light emitted from the projection unit and an exposureamount of the image capturing unit, and to adjust, in accordance withthe obtained adjustment amount, at least one of a first parameter forcontrolling the brightness of the pattern light emitted from theprojection unit and a second parameter for controlling the exposureamount of the image capturing unit; and (iv) a robot configured to holdthe target objects on the basis of a derivation result of the derivationunit to move the target objects.
 17. A measurement apparatus comprising:a projection unit configured to emit pattern light to target objects; animage capturing unit configured to acquire a single captured image bycapturing the target objects to which the projection unit has emittedthe pattern light; a derivation unit configured to derive, by using thesingle captured image, rough distances from the image capturing unit tothe captured target objects included in the single captured image; and acontrol unit configured to control at least one of a brightness of thepattern light emitted from the projection unit and an exposure amount ofthe image capturing unit in accordance with the rough distances, whereinthe derivation unit derives distances from the image capturing unit tothe target objects included in a single captured image obtained bycapturing, by the image capturing unit, the target objects to which theprojection unit has emitted the pattern light after the control unitcontrols the at least one of the brightness of the pattern light emittedfrom the projection unit and the exposure amount of the image capturingunit.